Image SXM Full Description

Image SXM is a version of the public domain image analysis software NIH Image that has been extended to handle the loading, display and analysis of scanning microscope images. Image SXM supports SAM, SCM, SEM, SFM, SLM, SNOM, SPM and STM images from the following systems: Asylum Research, Burleigh Instruments, Digital Instruments NanoScope II-III-IV, DME Rasterscope, DME Surface Data File, Gatan DigitalMicrograph, JEOL JSM, JEOL WinSem, JEOL WinSPM, JPK Instruments, Klocke Nanotechnik Atomikro, Leica LIF, Leica TCS, LEO SEM, Molecular Imaging PicoScan, NanoMagnetics Instruments SPMSIF, Nanonics Imaging, Nanonis, Nanosurf easyScan, Nanotec Electronica WSxM, Noran Instruments Vantage, NT-MDT, Omicron Vakuumphysik, Omicron SCALA, Oxford Instruments TOPSystem, Park Scientific Instruments HFS-LIF, Park Scientific Instruments HDF, Philips SEM, Quesant Instruments, RHK Technology SPM-32, RHK Technology XPM Pro, Seiko Instruments (SIINT) SPI, SPECS STM Aarhus, ThermoMicroscopes, TopoMetrix SPMLab, Unisoku, Vacuum Generators SAM, Veeco Innova, WA Technology, Zeiss AxioVision, Zeiss LSM.

Extensive rewrite using Xcode and GNU Pascal Compiler to create Intel-native version. Support has been added for Veeco, Leica SP5, Zeiss AxioVision, RHK Tech SM4 images. A new 'Microfibril Analysis' item has been added to the MIASMA menu.

Please contact Image SXM publisher, Steve Barrett if you have questions or issues regarding this product.

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